XRD is a technique employed to determine the underlying crystal structure of a material; it enables verification of the crystallinity and structure of a sample but gives no information of a chemical nature. X-ray diffraction is used to identify the presence of impurities or defects in a crystal and can reveal the nature of crystal lattice. It is often used in the analysis of materials to detect the impurity content and defects, and to check the purity of material. This is done by the use of X rays and the diffractogram of this material, which shows the pattern of diffracted rays.