Silterra Visit for Mylab Project: Defect Inspection Using Deep Learning Computer Vision For Software As A Service (SaaS)

UTM and Cuatro Services Sdn Bhd (Cuatro) has entered into an MOA to execute a pilot project for purpose of defect classification to X-FAB Sarawak Sdn Bhd (X-FAB). Cuatro Services Sdn Bhd has been awarded the contract for the same project from X-FAB. The pilot project only covers a maximum of 25 types of defects on metal layers only. The success of this pilot project will give strong justification for X-FAB to award Cuatro a global contract for improved and complete defect detection to be integrated into the existing production system.

The developed SaaS will expedite the adoption of Artificial Intelligence (AI) technology in the semiconductor Industry. In general, the semiconductor industry does not invest upfront capital in employing AI services. The experience between UTM and Cuatro Services Sdn. Bhd. in solving the X-FAB problem will facilitate the development. Currently, the X-FAB as subject matter expert has provided design requirements and the defect inspection will be used in the local area network within the factory. The cooperation of all involved parties has successfully met X-FAB expectations in terms of defect inspection accuracy. Hence, all the obtained experience and knowledge are ready to support the SaaS for defect inspection to be run in the cloud at UTM.

The same system can also be used by other wafer foundries all over the world such as Silterra, TSMC, SMIC, and Global Foundries through the proposed Software as a Service (SaaS) on Defect Inspection.

On 1st November 2021, we made a site visit to Silterra Malaysia to discuss more the project.