JSM-7800F

Incorporates 4 types of detectors:
1. Lower electron detector (LED).
2. Upper electron detector (UED)
3. Upper secondary electron detector (USD)
4. Backscattered electron detector (BED)

For the UED, the secondary electron and backscattered electron dose can be changed according to the filter voltage, making it possible to select the electron energy. The USD detects the low-energy electrons that bounce off the filter. With the BED, channeling contrast can be clearly observed by detecting the low-angle backscattered electrons. The LED enables acquisition of images with a 3-dimensional appearance, including the surface roughness information from the illumination effects.
https://people.utm.my/microscopy-lab/field-emission-scanning-electron-microscope-fesem/

Invitation to 

MJIIT Microscopy Lab Workshop Series 4

(FESEM-EDS & Sample Preparation)

28-30 August 2018 

MJIIT Microscopy Lab, UTM-KL

We are pleased to invite you to MJIIT Microscopy Lab Workshop Series 4 (FESEM-EDS & Preparation) which will be held on 28th – 30th August 2018 at Microscopy Laboratory, Malaysia-Japan International Institute of Technology (MJIIT), Universiti Teknologi Malaysia, Kuala Lumpur Campus (Jalan Sultan Yahya Petra, 54100 KL), organized in cooperation with JEOL (M) SDN BHD.

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About Our Workshop:

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Advanced microscopy is one of the most essential techniques in micro/nano-characterization to extract important information on the specimens. Efficient uses of advancedmicroscopy equipment require not only skills in equipment operation but also sufficient knowledge on the mechanism of image-formation in micrographs as well as good experiences of practical application of analysis to research. MJIIT Microscopy Lab Workshop Series aims to assist researchers and technicians to develop their skills and knowledge in order to encourage efficient uses of microscopy equipment and advance nano-characterization in Malaysia.

　　　Following the successfulness of our Workshop Series 1-3, we are glad to inform that we will organize another one, which is MJIIT Microscopy Laboratory Workshop Series 4 in cooperation with JEOL (M) SDN BHD. We are focusing on the fundamental knowledge and basic operation of FESEM – EDS as well as specimen preparation. We are pleased to welcome young engineers and researchers of all related industries and universities to join the MJIIT Microscopy Lab Workshop Series-4. 

The main topics in the course are:

Workshop Series 4: (2 days and a half)

The 1st day

1) Fundamentals of FESEM and JSM-7800F Prime

2) Image formation by Secondary Electrons (SE) and Back-Scatter Electrons (BSE)

3) How to separate topological and compositional images

4) Hands-on

The 2nd day

1) Sample preparation with a sputtering coater and an ion mill (Cross Section Polisher)

2) Hands-on

The 3rd day

1) Fundamentals of EDS in SEM

2) Introduction to datum-collection

3) Hands-on

The number to be admitted: 8

The charge for registration:  RM1,000,  

          + a free coupon to use FESEM JSM7800F for 1 time-session (1-hr/1 sample)

Due date for registration: 20 Aug 2018

Application Requirement:

1. Complete the registration form first before make the payment. We will notify you for the payment.
2. Participation is only confirmed after payment is made.
3. Payment is non-refundable upon cancellation.

For registration, please click here: https://goo.gl/AiiP4r

Using STEM to produce 3D

Produce the 3d using depth and overlap each image.

In 2D we dont know cubic or rhombohedral or plate like.

Precipitates shows point like contrast while dislocation can be seen a connection line from precipitates.

Need to know the distance precipitates in order to measure the distance of 3d.

By titling the sample it will produce the depth.